Action description language - PDFSEARCH.IO - Document Search Engine

Action description language
Results: 51

#	Item
31	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 3rd, 2008 8:00 – 9:00 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-10-06 12:58:03 IEEE standards Technology Joint Test Action Group Standards organizations Cron Differential Institute of Electrical and Electronics Engineers Attribute grammar Boundary scan description language Computing Electronics manufacturing Electronics
32	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for May 22nd, 2007 7:30 AM – 8:30 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-06-12 11:15:11 Boundary scan description language Joint Test Action Group Electromagnetism Boundary scan Attribute Electronics manufacturing Electronics Technology
33	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for April 24th , 2007 7:30 AM – 8:40 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-05-01 10:56:38 Electronic engineering Boundary scan description language Boundary scan Joint Test Action Group Minutes Cron Electronics manufacturing Electronics Technology
34	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 6th, [removed]AM – 10:15 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:51 Computing Technology Joint Test Action Group Standards organizations Institute of Electrical and Electronics Engineers Cron Boundary scan description language Boundary scan Electronics manufacturing Electronics IEEE standards
35	Section 13 – Scope of proposed project. The project develops Analog Boundary Scan Description Language (ABSDL), to describe the boundary scan implementation in a mixed-signal device conforming to IEEE[removed]A Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:21:38 Boundary scan description language Boundary scan Business Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
36	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for August 30th, [removed]AM – 12 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:56 Boundary scan description language Boundary scan Joint Test Action Group Business Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
37	Analog Boundary Scan Description Language (ABSDL) Bambang Suparjo Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Electronic engineering Boundary scan description language Joint Test Action Group Boundary scan Ethernet over twisted pair Electronics manufacturing Manufacturing Electronics
38	Cyclone III Device Handbook Volume 1. Chapter 12. IEEE[removed]JTAG) Boundary-Scan Testing for Cyclone III Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-04-23 01:52:16 Electronic engineering IEEE standards Embedded systems Joint Test Action Group Altera Boundary scan description language Boundary scan Electronics manufacturing Manufacturing Electronics
39	Chapter 7 Planning with applications to quests and story (DRAFT) Yun-Gyung Cheong, Mark O. Riedl, Byung-Chull Bae, Mark J. Nelson Add to Reading List Source URL: pcgbook.com Language: English - Date: 2014-05-07 07:45:00 Hierarchical task network Procedural generation Action description language STRIPS Logic programming Heuristic function Automated planning and scheduling Artificial intelligence Partial-order planning
40	IEEE[removed]Silicon Instruments with IEEE 1500 supported by Intellitech testers Add to Reading List Source URL: www.intellitech.com Language: English - Date: 2013-06-17 09:45:55 IEEE standards Electronic engineering Embedded systems Joint Test Action Group Boundary scan description language Intellitech Boundary scan IEEE Standards Association Field-programmable gate array Electronics manufacturing Manufacturing Electronics

UPDATE